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ヤマガミ ヒロシ
YAMAGAMI HIROSHI
山上 浩志 所属 京都産業大学 理学部 物理科学科 職種 教授 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 2008/02 |
| 形態種別 | 研究論文 |
| 査読 | 査読あり |
| 標題 | Photoemission and x-ray absorption studies of valence states in (Ni, Zn, Fe, Ti)(3)O(4) thin films exhibiting photoinduced magnetization |
| 執筆形態 | その他 |
| 掲載誌名 | APPLIED PHYSICS LETTERS |
| 出版社・発行元 | AMER INST PHYSICS |
| 巻・号・頁 | 92(8) |
| 著者・共著者 | M. Kobayashi,Y. Ooki,M. Takizawa,G. S. Son,A. Fujimori,Y. Takeda,K. Terai,T. Okane,S. -I. Fujimori,Y. Saitoh,H. Yamagami,M. Seki,T. Kawai,H. Tabata |
| 概要 | By means of photoemission and x-ray absorption spectroscopy, we have studied the electronic structure of (Ni,Zn,Fe,Ti)(3)O(4) thin films, which exhibits a cluster glass behavior with a spin-freezing temperature T(f) of similar to 230 K and photoinduced magnetization (PIM) below Tf. The Ni and Zn ions were found to be in the divalent states. Most of the Fe and Ti ions in the thin films were trivalent (Fe(3+)) and tetravalent (Ti(4+)), respectively. While Ti doping did not affect the valence states of the Ni and Zn ions, a small amount of Fe(2+), ions increased with Ti concentration, consistent with the proposed charge-transfer mechanism of PIM. (c) 2008 American Institute of Physics. |
| DOI | 10.1063/1.2885080 |
| ISSN | 0003-6951 |