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ヤマガミ ヒロシ
YAMAGAMI HIROSHI
山上 浩志 所属 京都産業大学 理学部 物理科学科 職種 教授 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 2009/05 |
| 形態種別 | 研究論文 |
| 査読 | 査読あり |
| 標題 | 4f-Derived Fermi Surfaces of CeRu2(Si1-xGex)(2) near the Quantum Critical Point: Resonant Soft-X-Ray ARPES Study |
| 執筆形態 | その他 |
| 掲載誌名 | PHYSICAL REVIEW LETTERS |
| 出版社・発行元 | AMER PHYSICAL SOC |
| 巻・号・頁 | 102(21) |
| 担当区分 | 責任著者 |
| 著者・共著者 | T. Okane,T. Ohkochi,Y. Takeda,S. -i Fujimori,A. Yasui,Y. Saitoh,H. Yamagami,A. Fujimori,Y. Matsumoto,M. Sugi,N. Kimura,T. Komatsubara,H. Aoki |
| 概要 | Angle-resolved photoelectron spectroscopy in the Ce 3d -> 4f excitation region was measured for the paramagnetic state of CeRu2Si2, CeRu2(Si0.82Ge0.18)(2), and LaRu2Si2 to investigate the changes of the 4f electron Fermi surfaces around the quantum critical point. While the difference of the Fermi surfaces between CeRu2Si2 and LaRu2Si2 was experimentally confirmed, a strong 4f-electron character was observed in the band structures and the Fermi surfaces of CeRu2Si2 and CeRu2(Si0.82Ge0.18)(2), consequently indicating a delocalized nature of the 4f electrons in both compounds. The absence of Fermi surface reconstruction across the critical composition suggests that SDW quantum criticality is more appropriate than local quantum criticality in CeRu2(Si1-xGex)(2). |
| DOI | 10.1103/PhysRevLett.102.216401 |
| ISSN | 0031-9007 |