ヤマガミ ヒロシ   YAMAGAMI HIROSHI
  山上 浩志
   所属   京都産業大学  理学部 物理科学科
   職種   教授
言語種別 英語
発行・発表の年月 2009/06
形態種別 研究論文
査読 査読あり
標題 Experimental observation of bulk band dispersions in the oxide semiconductor ZnO using soft x-ray angle-resolved photoemission spectroscopy
執筆形態 その他
掲載誌名 JOURNAL OF APPLIED PHYSICS
出版社・発行元 AMER INST PHYSICS
巻・号・頁 105(12)
著者・共著者 M. Kobayashi,G. S. Song,T. Kataoka,Y. Sakamoto,A. Fujimori,T. Ohkochi,Y. Takeda,T. Okane,Y. Saitoh,H. Yamagami,H. Yamahara,H. Saeki,T. Kawai,H. Tabata
概要 The electronic structure of the oxide semiconductor ZnO has been investigated using soft x-ray angle-resolved photoemission spectroscopy (ARPES). The obtained band dispersions within the k(x)-k(y) planes reflect the symmetry of the Brillouin zone and show no surface-state-derived flat bands. Band dispersions along the k(z) direction have also been observed. The obtained band dispersions qualitatively agree with band-structure calculations except for the bandwidth. The observations provide experimental evidence that soft x-ray ARPES enables us to study the bulk band structure of semiconductors. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3116223]
DOI 10.1063/1.3116223
ISSN 0021-8979