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セガワ コウジ
SEGAWA KOJI
瀬川 耕司 所属 京都産業大学 理学部 物理科学科 職種 教授 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 2009/09 |
| 形態種別 | 研究論文 |
| 査読 | 査読あり |
| 標題 | Universal critical behavior in single crystals and films of YBa2Cu3O7-delta |
| 執筆形態 | その他 |
| 掲載誌名 | PHYSICAL REVIEW B |
| 出版社・発行元 | AMER PHYSICAL SOC |
| 巻・号・頁 | 80(10) |
| 著者・共著者 | Hua Xu,Su Li,Steven M. Anlage,C. J. Lobb,M. C. Sullivan,Kouji Segawa,Yoichi Ando |
| 概要 | We have studied the normal-to-superconducting phase transition in optimally doped YBa2Cu3O7-delta in zero external magnetic field using a variety of different samples and techniques. Using dc transport measurements, we find that the dynamical critical exponent z=1.54 perpendicular to 0.14, and the static critical exponent nu=0.66 perpendicular to 0.10 for both films (when finite-thickness effects are included in the data analysis) and single crystals (where finite-thickness effects are unimportant). We also measured thin films at different microwave frequencies and at different powers, which allowed us to systematically probe different length scales to avoid finite-thickness effects. dc transport measurements were also performed on the films used in the microwave experiments to provide a further consistency check. These microwave and dc measurements yielded a value of z consistent with the other results, z=1.55+/- 0.15. The neglect of finite-thickness, finite-current, and finite-frequency effects may account for the wide ranges of values for nu and z previously reported in the literature. |
| DOI | 10.1103/PhysRevB.80.104518 |
| ISSN | 2469-9950/2469-9969 |