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セガワ コウジ
SEGAWA KOJI
瀬川 耕司 所属 京都産業大学 理学部 物理科学科 職種 教授 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 2014/04 |
| 形態種別 | 研究論文 |
| 標題 | Robust Protection from Backscattering in the Topological Insulator Bi1.5Sb0.5Te1.7Se1.3 |
| 執筆形態 | その他 |
| 掲載誌名 | PHYSICAL REVIEW LETTERS |
| 出版社・発行元 | AMER PHYSICAL SOC |
| 巻・号・頁 | 112(13) |
| 著者・共著者 | Sunghun Kim,Shunsuke Yoshizawa,Yukiaki Ishida,Kazuma Eto,Kouji Segawa,Yoichi Ando,Shik Shin,Fumio Komori |
| 概要 | Electron scattering in the topological surface state (TSS) of the topological insulator Bi1.5Sb0.5Te1.7Se1.3 was studied using quasiparticle interference observed by scanning tunneling microscopy. It was found that not only the 180 degrees backscattering but also a wide range of backscattering angles of 100 degrees-180 degrees are effectively prohibited in the TSS. This conclusion was obtained by comparing the observed scattering vectors with the diameters of the constant-energy contours of the TSS, which were measured for both occupied and unoccupied states using time-and angle-resolved photoemission spectroscopy. The robust protection from backscattering in the TSS is good news for applications, but it poses a challenge to the theoretical understanding of the transport in the TSS. |
| DOI | 10.1103/PhysRevLett.112.136802 |
| ISSN | 0031-9007/1079-7114 |
| PermalinkURL | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84898068033&origin=inward |