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ヤマガミ ヒロシ
YAMAGAMI HIROSHI
山上 浩志 所属 京都産業大学 理学部 物理科学科 職種 教授 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 2009/06 |
| 形態種別 | 研究論文 |
| 査読 | 査読あり |
| 標題 | Experimental observation of bulk band dispersions in the oxide semiconductor ZnO using soft x-ray angle-resolved photoemission spectroscopy |
| 執筆形態 | その他 |
| 掲載誌名 | JOURNAL OF APPLIED PHYSICS |
| 出版社・発行元 | AMER INST PHYSICS |
| 巻・号・頁 | 105(12) |
| 著者・共著者 | M. Kobayashi,G. S. Song,T. Kataoka,Y. Sakamoto,A. Fujimori,T. Ohkochi,Y. Takeda,T. Okane,Y. Saitoh,H. Yamagami,H. Yamahara,H. Saeki,T. Kawai,H. Tabata |
| 概要 | The electronic structure of the oxide semiconductor ZnO has been investigated using soft x-ray angle-resolved photoemission spectroscopy (ARPES). The obtained band dispersions within the k(x)-k(y) planes reflect the symmetry of the Brillouin zone and show no surface-state-derived flat bands. Band dispersions along the k(z) direction have also been observed. The obtained band dispersions qualitatively agree with band-structure calculations except for the bandwidth. The observations provide experimental evidence that soft x-ray ARPES enables us to study the bulk band structure of semiconductors. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3116223] |
| DOI | 10.1063/1.3116223 |
| ISSN | 0021-8979 |