ヤマガミ ヒロシ
YAMAGAMI HIROSHI
山上 浩志 所属 京都産業大学 理学部 物理科学科 職種 教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2001/06 |
形態種別 | 研究論文 |
査読 | 査読あり |
標題 | Comparative study of the electronic structure of XRu2Si2: probing the Anderson lattice |
執筆形態 | その他 |
掲載誌名 | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA |
出版社・発行元 | ELSEVIER SCIENCE BV |
巻・号・頁 | 117,pp.347-369 |
著者・共著者 | JD Denlinger,GH Gweon,JW Allen,CG Olson,MB Maple,JL Sarrao,PE Armstrong,Z Fisk,H Yamagami |
概要 | dThe k-resolved single particle excitations, as determined by angle-resolved photoemission spectroscopy (ARPES), are compared and contrasted for, LaRu2Si2, CeRu2Si2, ThRu2Si2, and URu2Si2, isostructural layered compounds with differing nominal f-occupations of f(0), f(1), f(0), and f(2), respectively. ARPES measurements include 4d and Sd-edge resonant photoemission to distinguish S-character and Fermi-energy intensity mapping of Fermi surface contours. Comparison to RLAPW band structure calculations shows very good agreement of the d-band structure away from E-j. Discrepancies in the near E-j region highlight k-dependent effects of f-correlation and f-d hybridization. Approximately equal dimensions of Fermi contours for X = (La, Ce) suggest the exclusion of 4f electrons from the CeRu2Si2 Fermi surface at temperatures far above the Kondo temperature. High-resolution spectra for X= (Ce, U) allow comparison of f-d mixing to predictions of the Anderson lattice model. Published by Elsevier Science B.V. |
DOI | 10.1016/S0368-2048(01)00257-2 |
ISSN | 0368-2048 |